Specialist : Barış DEMİRCİ
Phone : +90 212 359 74 20
Fax : +90 212 358 27 24
E-mail : email@example.com
USPM model is a small sample AFM and STM that rasters the sample rather than the probe and has a small mechanical path that allows atomic resolution AFM and STM. It has a built in 250X video microscope, easy change cantilever, a 40µm x 40µm x 4µm scan tube assembly and Acoustic/Vibration Isolation Chamber (AVIC) is included.
Q-Scope USPM features include:
250X video microscope with 90 degree top-down view for easy alignment and positioning of the AFM probe. Tip and surface view is 45 degrees during STM operation.
Easy-to-use controls permit rapid probe exchange and alignment, sample approach, and intuitive display and adjustment of all SPM operating parameters. There is a micrometer-driven X-Y translation of the scan head over the sample.
Virtually all AFM imaging modes, including WaveModeTM intermittent-contact mode, which can capture topographic, lateral force, phase, magnetic and force- distance curves are standard.
Patented Analoop™ analog PID feedback loop that is digitally controlled which allows more accurate data gathering and has an extremely fast sampling frequency.
Staging Systems :
Maximum sample size: 25(x) X 25(y) X 8(z)mm
X-Y translation: +/- 5mm (manual)
Sample mounting: 20mm diameter platform
Simple exchange of scanners, probe modules (i.e. AFM to STM), and cantilevers
Video view: 250X, 0.75mm FOV, 90° to sample
Sample illumination: LED
Realtime image acquisition software features include:
Realtime surface leveling, adjustment to PID controls, adjustment of scan controls, undo/redo functions to allow capture of previous or partial images, image capture up to 1024 lines X 1024 pixels, slope shading or perspective illumination, hardware and software image zoom.
Image analysis and rendering software features include:
Variety of curve fitting/leveling mechanisms on a line-by-line or entire image basis, image streak and/or spot artifact removal, 2D FFT analysis with unique image conjugate erase functions that allows easy identification and removal of periodic features, line profile extraction on single or multiple lines, automated bimodal histogram function for statistically significant step height measurements.